Adaptive large neighborhood search algorithm – performance evaluation under parallel schemes & applications

Adaptive Large Neighborhood Search (ALNS) is a fairly recent yet popular single-solution heuristic for solving discrete optimization problems. Even though the heuristic has been a popular choice for researchers in recent times, the parallelization of this algorithm is not widely studied in the literature compared to the other classical metaheuristics. To extend the existing literature, this study proposes several different parallel schemes to parallelize the basic/sequential ALNS algorithm. More specifically, seven different parallel schemes are employed to target different characteristics of the ALNS algorithm and the capability of the local computers. The schemes of this study are implemented in a master-slave architecture to manage and assign loads in processors of the local computers. The overall goal is to simultaneously explore different areas of the search space in an attempt to escape the local minima, taking effective steps toward the optimal solution and, to the end, accelerating the convergence of the ALNS algorithm. The performance of the schemes is tested by solving a capacitated vehicle routing problem (CVRP) with available wellknown test instances. Our computational results indicate that all the parallel schemes are capable of providing a competitive optimality gap in solving CVRP within our investigated test instances. However, the parallel scheme (scheme 1), which runs the ALNS algorithm independently within different slave processors (e.g., without sharing any information with other slave processors) until the synchronization occurs only when one of the processors meets its predefined termination criteria and reports the solution to the master processor, provides the best running time with solving the instances approximately 10.5 times faster than the basic/sequential ALNS algorithm. These findings are applied in a real-life fulfillment process using mixed-mode delivery with trucks and drones. Complex but optimized routes are generated in a short time that is applicable to perform last-mile delivery to customers

Design of Hybrid Network Anomalies Detection System (H-NADS) Using IP Gray Space Analysis

In Network Security, there is a major issue to secure the public or private network from abnormal users. It is because each network is made up of users, services and computers with a specific behavior that is also called as heterogeneous system. To detect abnormal users, anomaly detection system (ADS) is used. In this paper, we present a novel and hybrid Anomaly Detection System with the uses of IP gray space analysis and dominant scanning port identification heuristics used to detect various anomalous users with their potential behaviors. This methodology is the combination of both statistical and rule based anomaly detection which detects five types of anomalies with their three types of potential behaviors and generates respective alarm messages to GUI.Network Security, Anomaly Detection, Suspicious Behaviors Detection

ATLAS IBL Pixel Upgrade

The upgrade for ATLAS detector will undergo different phase towards super-LHC. The first upgrade for the Pixel detector will consist of the construction of a new pixel layer which will be installed during the first shutdown of the LHC machine (LHC phase-I upgrade). The new detector, called Insertable B-Layer (IBL), will be inserted between the existing pixel detector and a new (smaller radius) beam-pipe at a radius of 3.3 cm. The IBL will require the development of several new technologies to cope with increase of radiation or pixel occupancy and also to improve the physics performance which will be achieved by reducing the pixel size and of the material budget. Three different promising sensor technologies (planar-Si, 3D-Si and diamond) are currently under investigation for the pixel detector. An overview of the project with particular emphasis on pixel module is presented in this paper.Comment: 3 pages, 3 figures, presented at the 12th Topical Seminar on Innovative Particle and Radiation Detectors (IPRD10) 7 - 10 June 2010, Siena (IT). Accepted by Nuclear Physics B (Proceedings Supplements) (2011

Ecocriticism as a Reappraisal of Romanticism

Ecocriticism is a contemporary theory of analysing art or literature. The green criticism studies literature from nature’s perspective. When environment is hot cake topic of the time, ecocriticism gains rapid popularity. The present study explores how study of nature evolves down the ages from Romanticism to Ecocriticism and how ecocriticism turns to be a modified version of Romanticism. There is a wide gap of almost two centuries between the movements. Yet there are some similarities that validate the claim that Ecocriticism is the reappraisal of romanticism in as broader sense. The rudiments of ecocriticism are found in the poetry of Wordsworth, Coleridge, Keats, Southey, Clare and many other poets of the romantic age. The paper is an attempt to explore the ecocritical praxis of the Romantic Literature in general

DEFECTS & DISORDERS IN SEMICONDUCTORS

                     Defects are always undesirable,if only as an indication that the production technology is not fully understood & controlled. Hence it is necessary to have techniques to locate,identify & determine the origin of defects present.                                                                          Defects in semiconductor are a problem because of their electronic & optoelectronic effect.Thus it is necessary to be able to determine the electronic properties of defects.A number of techniques are also available for the electronic characterization of defect microstructure such as SEM-EBIC(Scanning electron microscope- electron beam induced current),SEM-CL(Cathodo luminescence)& LBIC (Laser or light beam induced current)                     Defects are always undesirable,if only as an indication that the                             production technology is not fully understood & controlled.Hence                            it is necessary to have techniques to locate,identify & determine the                              origin of defects present.                                                                          Defects in semiconductor are a problem                              because of their electronic & optoelectronic effect.Thus it is necessary                              to be able to determine the electronic properties of defects.A number                              of techniques are also available for the electronic characterization of                             defect microstructure such as SEM-EBIC(Scanning electron microscope-                              electron beam induced current),SEM-CL(Cathodo luminescence)& LBIC                              (Laser or light beam induced current